Keithley 2450 Series Graphical Source Measure Unit, ±20 mV to ±200 V, ±10 nA to ±1 A, 20W Output 2450

Keithley 2450 Series Source Meter is a precision graphical source measure unit delivering a voltage range of ±20 mV to ±200 V and current range of ±10 nA to ±1 A, with a continuous output power rating of 20W. This fourth-generation SMU instrument combines a highly flexible four-quadrant voltage and current source/load with precision voltage and current metering capabilities.

Ideal for industrial, laboratory, semiconductor characterization, printed electronics, organic semiconductors, and other advanced material testing applications, the 2450 offers excellent accuracy with 0.012% basic measurement accuracy at 6½ digits resolution. It is equipped with a user-friendly five-inch capacitive touchscreen for ease of use and fast data visualization.

Key features include four operating quadrants for sourcing and sinking voltage and current, enabling versatile charge and discharge tests. The instrument supports programming via multiple modes including 2450 SCPI and TSP scripting, as well as backwards compatibility with legacy 2400 SCPI commands. It also provides four Quickset modes to streamline measurement processes.

Interfacing is facilitated through front panel banana jacks and rear panel triaxial connectors, offering flexible connection options. The front panel USB port supports memory sticks for storing measurements, programs, and configuration files as well as for firmware upgrades.

The Keithley 2450 excels in precision testing and characterization of scaled semiconductors, nano-scale devices, and materials, making it a versatile bench instrument for research and development, quality control, and manufacturing environments.

High-resolution graphical touchscreen interface enhances control and ease of use. Precision 6½-digit measurement with 0.012% accuracy ensures reliable data. Four quadrant source and sink operation supports comprehensive device testing.

Multiple programming and scripting modes improve integration flexibility. Robust front and rear panel connections enable diverse instrumentation setups. Front panel USB port for data storage and firmware updates simplifies workflow.

Suitable for nano-scale devices, organic semiconductors, and semiconductor device characterization.

This product is made in China and adheres to UL, EN 61326-1, and 89/336/EEC standards and approvals. Explore the Keithley range and related Source Meter instruments on EnvMart to find suitable test and measurement solutions.