Keithley 2600 Series Source Meter, ±100 mV to ±40 V, 2-Channel, ±100 nA to ±10 A, 80W Output 2602B

Keithley 2602B Source Meter from the 2600 Series is a high-performance, 2-channel source measure unit designed for precision testing in a variety of industrial, laboratory, and manufacturing environments. It features a voltage range of ±100 mV to ±40 V and a current range of ±100 nA to ±10 A delivering an output power of 80 W.

Built upon Keithley's 3rd generation Source Measure Unit (SMU) technology, the 2602B integrates capabilities typically requiring multiple instruments, including a precision power supply, true current source, 6½ digit digital multimeter, arbitrary waveform generator, pulse generator, and electronic load.

This source meter supports 4-quadrant voltage/current sourcing and measurement with high resolution readings via a 2-line vacuum fluorescent display. It includes advanced features such as Test Script Processing (TSP) technology, which embeds complete test programs enabling best-in-class throughput for system-level automation.

The 2602B device incorporates TSP-Link expansion technology to facilitate multi-channel parallel testing without reliance on a mainframe, enhancing scalability for complex testing rigs.

Communication interfaces include USB 2.0, LXI-C, GPIB, RS-232, and digital I/O, ensuring versatile connectivity across diverse industrial and laboratory setups. The instrument withstands rigorous compliance with standards such as UL, 89/336/EEC, and EN 613261.

Resistance measurement capability spans an extensive range from 500 nΩ to 40 TΩ, suitable for a wide array of applications including semiconductor wafer testing, nanomaterial characterization, discrete components testing, organic electronics, and material resistivity and Hall effect measurement.

The 2602B comes supplied with operator and programming manuals, low noise Triax cables with alligator clips, terminal connectors with strain relief and covers, Ethernet cables, and embedded software tools such as TSP Express and Test Script Builder. Additionally, LabVIEW drivers are provided for seamless integration into automated test systems.

Features 4-quadrant voltage/current source and measurement with 6½ digit resolution. Test Script Processing (TSP) technology for embedded test program execution. TSP-Link technology allows multi-channel parallel testing without a mainframe.

Supports diverse communication interfaces including USB 2.0, LXI-C, GPIB, and RS-232. Wide voltage and current source ranges provide flexibility for testing a variety of device types. Extended resistance measurement range from 500 nΩ to 40 TΩ.

Compliant with UL and EMC standards ensuring operational safety and reliability. Includes comprehensive software tools and programming drivers for automation and integration. Ideal for applications in semiconductor, nanomaterials, discrete components, organic electronics, and material characterization.

Explore the full range of Keithley Source Meters and advanced test instruments at EnvMart for reliable, precision performance in electronic testing and measurement solutions.