Keithley 2400 Series Source Meter 200 mV to 1000 V, 10 nA to 1 A, 20W Output 2470

Keithley 2470 Source Meter is a next-generation source measure unit (SMU) integrating a broad voltage range of 200 mV to 1000 V and current capacity from 10 nA up to 1 A with a 20W output power limit. This instrument combines precise sourcing and measurement with advanced touchscreen GUI technology, making it suitable for industrial, laboratory, manufacturing, and research environments.

The 2470 SMU features an innovative graphical user interface and a capacitive touch display that reduces the learning curve and enhances user efficiency. It supports a wide range of test requirements including resistance measurement over 2 Ω to 200 MΩ and allows source and sink operations through its four quadrants.

Programmable via SCPI and TSP scripting, the 2470 enables automation and integration into complex test systems. The TSP-Link facilitates multi-channel current-voltage testing, essential for detailed device characterization.

Connectivity options include front panel banana jacks and rear panel high-voltage triaxial connections, complemented by a USB 2.0 port for memory I/O operations which simplify data and test script transfer.

This source meter is specifically designed for characterizing and testing power semiconductor devices such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, as well as transient suppression devices, power modules, and batteries. The high resolution measurement capabilities down to 10 fA make it ideal for low leakage current measurements.

Key industrial applications include automotive electronics testing, battery testing, embedded systems design validation, power measurements and analysis, education, and manufacturing troubleshooting.

Offers 20W output power for flexible source and measurement applications. High precision 10 fA measurement resolution optimizes testing accuracy. Intuitive 5-inch capacitive touchscreen GUI for improved ease of use. Supports 4-quadrant source and sink operation for comprehensive testing.

Control via SCPI and TSP scripting allows extensive automation. TSP-Link supports multi-channel I-V testing for advanced analysis. Equipped with front panel banana jacks and rear triaxial connectors for versatile connectivity.

USB 2.0 memory I/O port enables straightforward data and script transfer. Optimized for testing high voltage, low leakage devices and power semiconductors. Ideal for automotive, manufacturing, educational, and laboratory applications.

Explore the full range of Keithley source meters and related instrumentation at EnvMart for high-precision and dependable industrial testing solutions.

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