Keithley 2600 Series Source Meter, Current Voltage Source Measure Current Resistance Voltage, ±100 mV to ±40 V, ±100 2601B

Keithley 2601B Source Meter from the 2600 series provides an integrated current and voltage source and measurement instrument with ±100 mV to ±40 V voltage range and ±100 nA to ±10 A current range, capable of delivering 40W output power. Designed using Keithley's 3rd generation SMU technology, it combines precision power supply, true current source, 6½ digit digital multimeter, arbitrary waveform generator, pulse generator, and electronic load capabilities in a single instrument. The source meter facilitates high resolution measurements with a 2-line VFD display and is operated through embedded Java-based test software enabling browser-based plug-and-play I/V characterization from any location.

This versatile instrument supports Test Script Processing (TSP) technology that embeds complete test programs, offering best-in-class system-level throughput, and TSP-Link expansion for multi-channel parallel testing without the need for a mainframe. It has multi-interface support including USB 2.0, LXI-C, GPIB, RS-232, and digital I/O, enhancing its adaptability to various test systems.

The 2601B model is ideal for a wide range of applications, including testing semiconductor wafers and thin films, nanomaterials such as graphene and carbon nanotubes, discrete components like resistors and diodes, organic electronic devices, and advanced material characterization such as resistivity and Hall effect measurements.

This product is supplied with comprehensive operator and programming manuals, a 2m low noise Triax cable with alligator clips, mating screw terminal connectors with strain relief and covers, two TSP-Link/Ethernet cables, embedded TSP Express software, Test Script Builder software on CD, and LabVIEW drivers.

Provides 4-quadrant voltage/current source and measurements with 6½ digit resolution and 2-line VFD display. Built-in Java-based test software enables remote browser access for testing. Test Script Processing (TSP) technology embeds complete test programs for enhanced throughput.

TSP-Link expansion supports multi-channel parallel testing without mainframe requirements. Supports USB 2.0, LXI-C, GPIB, RS-232, and digital I/O interfaces. Application suited for semiconductor, nanomaterials, discrete components, organic materials, and material characterization.

Supplied with cables, connectors, and comprehensive software tools for immediate use.

This Keithley source meter provides industry-leading performance for laboratory, research & development, production test, and quality assurance environments, making it ideal for precise electrical characterization tasks. Explore more specialized Source Meter models in the Keithley 2600 series on EnvMart.