Aries Electronics 2.54 mm Pitch 48 Way DIP Through Hole Test IC Socket 48-6554-11

Aries Electronics 48-6554-11 2.54 mm Pitch 48 Way DIP Through Hole Test IC Socket is a high-quality test socket designed for reliable and precise electrical connections in industrial and electronic assembly applications. Its DIP package style supports through hole mounting, ideal for PCB applications requiring stable device retention and testing.

The socket features 48 contacts arranged in two rows with a pitch of 2.54 mm and a row pitch of 15.24 mm, matching standard DIP IC footprints. Contact materials use beryllium copper alloy plated with gold over nickel to provide excellent conductivity and corrosion resistance, ensuring signal integrity.

This test socket supports a current rating of 1 ampere and withstands voltages up to 1 kV, making it suitable for a broad range of electronic testing scenarios. The housing is constructed from black glass-filled polyphenylene sulphide (PPS), meeting UL 94V-0 flame-retardant standards for enhanced safety and durability in industrial environments.

Operating temperature ranges from -65°C to 150°C, allowing usage in harsh conditions from cold storage to high-temperature laboratory environments. The stainless steel handle facilitates easy insertion and removal of IC devices, with configurable closed contacts in either handle position and mounting flexibility on the right or left sides.

This zero-insertion-force (ZIF) test socket series is designed specifically for universal compatibility, accepting devices spaced between 7.62 mm and 15.24 mm centers. Its lifespan ranges between 25,000 and 50,000 operational cycles, suitable for repeated testing or prototyping in industrial, laboratory, and manufacturing settings.

Features a package type of DIP suitable for through hole mounting. Constructed with beryllium copper alloy contacts plated with gold over nickel for enhanced conductivity and durability. Supports up to 1 ampere current and 1 kV voltage for stable operation.

Two-row configuration with 48 contacts and 15.24 mm row pitch for precise device placement. Operating temperature range from -65°C to 150°C ensures performance in harsh environments. The socket housing is made from black glass-filled polyphenylene sulphide rated UL 94V-0 for flame resistance.

Designed as a universal zero-insertion-force test socket suitable for devices on 7.62 to 15.24 mm centers. Socket handle is stainless steel and can be mounted on either side with configurable closed contacts. Provides a long life cycle between 25,000 to 50,000 insertions ensuring durability in testing applications.

Made in the United States ensuring high manufacturing standards.

This IC socket is ideal for industrial electronics manufacturing, laboratory testing, quality assurance processes, and other applications requiring robust and reliable IC device connections. Its design emphasizes longevity, ease of use, and compatibility, making it an essential component for IC testing setups.

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