Yamaichi 0.5 mm Pitch 32 Way QFN Through Hole Test IC Socket QFN11T032-003

Yamaichi QFN11T032-003 0.5 mm Pitch 32 Way QFN Through Hole Test IC Socket is an advanced electronic component designed for high-precision testing of QFN packages. Featuring 32 contacts arranged in 2 rows at a 0.5 mm pitch, this IC socket ensures accurate and reliable interconnectivity during testing procedures.

The housing is constructed from high-performance materials - Polyetherimide and Polyethersulfone - providing excellent mechanical strength and thermal stability across a broad operating temperature range of -55°C to 170°C.

Contacts are crafted from a Beryllium Copper Alloy with Gold over Nickel plating, offering superior electrical conductivity and resistance to wear and corrosion. The through-hole mounting type enhances mechanical stability on test PCBs, while the surface device mount ensures compatibility with standard QFN devices.

This test socket operates at voltages up to 700 V and includes a spring-loaded clamshell hinged lid, which facilitates easy insertion and removal of ICs with consistent contact force of approximately 11 gf per pin, ensuring test repeatability and durability.

The socket is suited for industrial electronic test equipment, laboratory testing setups, manufacturing quality control, and R&D facilities requiring precise IC socketing solutions.

It offers reliable and stable connections necessary for accurate test measurements and functional verifications. The product is designed without requiring standard approvals or certifications, focusing purely on functional test reliability.

This Yamaichi test IC socket is a critical tool in environments involving semiconductor device validation, component characterization, and circuit board testing. Explore EnvMart's comprehensive catalog of IC Sockets and test connectors to find compatible components and accessories designed for today's advanced electronic testing demands.