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RIGOL Low-Voltage Differential PVA8350 Active Probe For MSO/DS7000 Series
Specifications
| Country of Origin | China |
|---|---|
| Brand | Rigol |
| Model | PVA8350 |
| Bandwidth | 3.5 GHz |
| Probe type | Low-Voltage Differential Active Probe |
| Product Condition | New |
| MPN | PVA8350 |
| Compatible Oscilloscope Models | DS70000 Series, DS8000-R Series, MSO8000/MSO8000A Series, MSO/DS7000 Series |
| Designed Use | High-speed signal integrity testing and precision digital waveform capture |
Key Features
Rigol PVA8350 Low-Voltage Differential Active Probe for advanced high-frequency signal testing in laboratory environments.
- Provides 3.5 GHz bandwidth for ultra-fast and precise measurements.
- Designed specifically for use with Rigol DS70000, DS8000-R, MSO8000, MSO8000A, and MSO/DS7000 series oscilloscopes.
- Ensures low-voltage differential active probing for high signal integrity.
- Suited to high-speed communication analysis and digital waveform capture.
- Enables accurate and reliable signal fidelity even at high frequencies.
- Easy probe connection and compatibility with modern laboratory setups.
- Robust construction for continuous use in industrial and research environments.
Product Description
The Rigol PVA8350 Low-Voltage Differential Active Probe is a high-performance tool designed for precise signal integrity testing in laboratories, research, and industrial environments. With a 3.5 GHz bandwidth, it enables engineers and researchers to capture high-speed digital signals and analyze fast communication waveforms with minimal signal loss. Its active differential design ensures accurate waveform acquisition, while compatibility with Rigol oscilloscopes including DS70000, DS8000-R, MSO8000/MSO8000A, and MSO/DS7000 allows seamless integration into modern test setups. Built for reliability and durability, the PVA8350 supports demanding applications in semiconductor testing, telecom R&D, industrial QA, and advanced scientific research. Commonly used for high-speed serial data analysis, digital bus monitoring, electronic component characterization, and compliance testing, it delivers dependable performance with ultra-fast edge signal analysis and secure probe connections, making it an essential tool for engineers and researchers requiring precise, high-frequency measurements.
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