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Upright Metallurgical Microscope EMM-B30
Specifications
| Country of Origin | UK |
|---|---|
| Brand | Generic Brand |
| Model | LMM-B30 |
| Optical System | NIS45 Infinite Color Corrected Optical System (Tube length — 180mm) |
| Type of Product | Microscope |
| Focusing | Low-hand Motorized auto focusing mechanism / independent operation of left and right-hand wheels / three-speed speed adjustment / focusing range 30mm / repeat positioning accuracy — ±0.1μm / motorized escape and recovery mechanism |
| Eyepiece | Super wide field plan eyepiece SW10X/25mm / diopter adjustable |
| Viewing Head | Seidentopf Trinocular Head / 30° inclined / interpupillary distance — 47mm–78mm | splitting ratio Eyepiece — Trinocular equal to 100 — 0 or 20 — 80 or 0 — 100 |
| Nosepiece | Backward Motorized Sextuple Nosepiece (with DIC slot) |
| Magnification Range | 50x to 1000x |
| Stage Movement | X-axis — 125mm / Y-axis — 75mm / accuracy ±1.5μm / speed up to 20mm/s |
| Reflected Illumination | Reflected light 24V/100W halogen lamp / Koehler illumination / with 6-position turret | Built-in ND6 / ND25 filter and color correction filter |
| Max. Specimen Height | 76mm |
| Stage Size | 275 × 239 × 44.5mm |
| Motorized Control | Nosepiece control panel with buttons | Two most used objectives can be pre-set and switched | Auto light intensity adjustment after objective change |
Key Features
- Electric objective lens switching
- Brightfield and darkfield observation
- Low-hand auto-focusing mechanism
- Differential interference contrast (DIC)
- LED brightness adjustment
- User-friendly Touch interface
- Input control navigation system
- Long working distance objectives
Product Description
Upright Metallurgical Microscope LMM-B30 incorporates motorized auto-focusing with 0.1μm repeat positioning accuracy for sharp imaging. It provides a 50x to 1000x magnification range, ensuring detailed sample observation. The motorized X-Y stage enables precise control with 125mm travel on the X-axis and 75mm on the Y-axis. A joystick and touch screen controller simplify adjustments, enhancing user convenience. Designed for detailed metallurgical studies and industrial quality assessments.
Applications:
Our Upright Metallurgical Microscope LMM-B30 is designed for high-precision metallurgical structure analysis, semiconductor inspection, and material science research. It is widely used for detecting micro defects, surface irregularities, and optical characterization in industrial laboratories.
Standard Accessories:
- Dust Cover
- Power Cord
Objective:NIS45 Infinite LWD Plan Semi-APO Objective (BF & DF) — 5X/NA equal to 0.15 / WD equal to 20mm | 10X/NA equal to 0.3 / WD equal to 11mm | 20X/NA equal to 0.45 / WD equal to 3.0mm | 50X/NA equal to 0.8 / WD equal to 1.0mm | 100X/NA equal to 0.9 / WD equal to 1.0mm
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Frequently Asked Questions
It features the NIS45 Infinite Color Corrected Optical System with a tube length of 180mm, ensuring high-quality imaging.
The motorized auto-focusing mechanism has a repeat positioning accuracy of ±0.1μm, providing sharp imaging for detailed analysis.
The stage size is 275 × 239 × 44.5mm, accommodating various specimen sizes during observation.
This model can accommodate specimens with a maximum height of 76mm.
It uses a reflected light 24V/100W halogen lamp with Koehler illumination and a 6-position turret for optimal lighting during observation.
The stage allows for X-axis movement of 125mm and Y-axis movement of 75mm, with an accuracy of ±1.5μm and speed up to 20mm/s.
It is equipped with a super wide field plan eyepiece SW10X/25mm that is diopter adjustable for enhanced viewing comfort.
User convenience is enhanced by a joystick and touch screen controller for adjustments, alongside a motorized control panel for the nosepiece.
The standard accessories include a dust cover and a power cord, ensuring the microscope is ready for use upon delivery.
It features a backward motorized sextuple nosepiece that includes a DIC slot for differential interference contrast applications.
This microscope is designed for high-precision metallurgical structure analysis, semiconductor inspection, and material science research.
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