The LAFM-A11 Atomic Force Microscope features a combined design of scan head and sample stage to provide strong anti-vibration performance. It is adopted with a servomotor that drives the sample to approach the tip manually or automatically, allowing precise evaluation of the scanning area position. Equipped with a precision laser detection system and probe alignment device, it enables easy adjustment of the laser beam.

Software Features:

• Captures and displays multi-channel images simultaneously, with real-time profile map observation
• Measures multiple curves such as F-Z, F-RMS, RMS-Z³
• Executes move and cut functions of scan area, allowing selection of an area of interest
• Scans sample in 0 to 360° angle range
• Adjusts laser spot detection system in real time
• Selection and setting for different color scanning images in palette
• Supports linear average and offset calibration in real time for sample tilt
• Supports scanner sensitivity calibration and electronic controller auto-calibration
• Supports offline analysis and processing of sample image

Applications:

It provides the best solution for applications in biochemistry for tissues, cells, and cellular components imaging, nanotechnology for imaging of polymers and nanomaterials, and in chemistry and physics for imaging surface metals and elements.