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Labtron LAFM-A10 Atomic Force Microscope
Specifications
| Country of Origin | UK |
|---|---|
| Resolution | X/Y axis — 0.2 nm / Z axis — 0.05 nm |
| Brand | Labtron |
| Net Weight | 40 Kg |
| Sample Size | Ø ≤ 90 mm / H ≤ 20 mm |
| Model | LAFM-A10 |
| Gross Weight | 50 Kg |
| Type of Product | Microscope |
| Scan Rate | 0.6 Hz to 4.34 Hz |
| Operation Modes | Contact mode / friction mode / tapping phase (extended) / MFM / EFM / random angle scans |
| Scan Angle | Random angle |
| Maximum Scan Range | X/Y axis — 20 µm / Z axis — 2 µm |
| Optical System / Magnification | Magnification — 4x / Resolution — 2.5 µm |
| Sample Movement | 0 to 20 mm |
| Pulse Width of Approaching Motor | 10 ± 2 ms |
| Scanning Control | XY — 18 bit D/A & double 16 bit A/D / multiple channel simultaneously |
| Types of Sampling Pixel | 256×256 / 512×512 |
| Feedback Type | DSP digital feedback |
| Feedback Sampling Rate | 64 kHz |
| PC Connections | USB 2.0 |
| Windows Software Compatibility | Windows 98/2000/XP/7/8 |
| Instrument Dimension | 415 × 410 × 545 mm |
Key Features
- Large range of sample transfer
- Modular electronic system for easy maintenance
- Adopted with spring for vibration isolation
- Provides highly accurate results
- Optical observation system for checking tip & sample’s position
Product Description
The LAFM-A10 Atomic Force Microscope features a combined design of scan head and sample stage to provide strong anti-vibration performance. It is equipped with a precision laser detection system and probe alignment device for simple and easy laser beam adjustment.
Software Features:
- 2 types of sampling pixel for selection (256×256, 512×512)
- Selection of an area of interest for sampling by executing scan area move and cut function
- Scans sample in random angle at beginning
- Adjustment of laser spot detection system in real time
- Selection and setting for different color scanning images in palette
- Supports linear average and offset calibration in real time for sample tilt
- Supports scanner sensitivity calibration and electronic controller auto-calibration
- Supports offline analysis and processing of sample image
Applications:
It provides the best solution for applications in biochemistry for tissues, cells, and cellular components imaging, nanotechnology for imaging of polymers and nanomaterials, and in chemistry and physics for imaging surface metals and elements.
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Previous
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Share
Free Delivery in India | Lowest Global Shipping Charges
24/7 Customer Support
Shop with confidence knowing that our 24/7 Customer Support is always available to assist with any inquiries
Save up to 28% with GST Input
Avail maximum benefits from input tax mechanism on all your Business Invoices. Get GST Invoices on your business purchases. And 0% Taxes on all worldwide deliveries
# Lowest Price Challenge
If you find this product anywhere at lower cost than us. Call us and we will not only match the price but also give a complimentary coupon
100% Original Products
Shop with assurance, as each product we offer is 100% original, ensuring quality and authenticity with every purchase
Labtron LAFM-A10 Atomic Force Microscope
Specifications
| Country of Origin | UK |
|---|---|
| Resolution | X/Y axis — 0.2 nm / Z axis — 0.05 nm |
| Brand | Labtron |
| Net Weight | 40 Kg |
| Sample Size | Ø ≤ 90 mm / H ≤ 20 mm |
| Model | LAFM-A10 |
| Gross Weight | 50 Kg |
| Type of Product | Microscope |
| Scan Rate | 0.6 Hz to 4.34 Hz |
| Operation Modes | Contact mode / friction mode / tapping phase (extended) / MFM / EFM / random angle scans |
| Scan Angle | Random angle |
| Maximum Scan Range | X/Y axis — 20 µm / Z axis — 2 µm |
| Optical System / Magnification | Magnification — 4x / Resolution — 2.5 µm |
| Sample Movement | 0 to 20 mm |
| Pulse Width of Approaching Motor | 10 ± 2 ms |
| Scanning Control | XY — 18 bit D/A & double 16 bit A/D / multiple channel simultaneously |
| Types of Sampling Pixel | 256×256 / 512×512 |
| Feedback Type | DSP digital feedback |
| Feedback Sampling Rate | 64 kHz |
| PC Connections | USB 2.0 |
| Windows Software Compatibility | Windows 98/2000/XP/7/8 |
| Instrument Dimension | 415 × 410 × 545 mm |
Key Features
- Large range of sample transfer
- Modular electronic system for easy maintenance
- Adopted with spring for vibration isolation
- Provides highly accurate results
- Optical observation system for checking tip & sample’s position
Product Description
The LAFM-A10 Atomic Force Microscope features a combined design of scan head and sample stage to provide strong anti-vibration performance. It is equipped with a precision laser detection system and probe alignment device for simple and easy laser beam adjustment.
Software Features:
- 2 types of sampling pixel for selection (256×256, 512×512)
- Selection of an area of interest for sampling by executing scan area move and cut function
- Scans sample in random angle at beginning
- Adjustment of laser spot detection system in real time
- Selection and setting for different color scanning images in palette
- Supports linear average and offset calibration in real time for sample tilt
- Supports scanner sensitivity calibration and electronic controller auto-calibration
- Supports offline analysis and processing of sample image
Applications:
It provides the best solution for applications in biochemistry for tissues, cells, and cellular components imaging, nanotechnology for imaging of polymers and nanomaterials, and in chemistry and physics for imaging surface metals and elements.
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$118.12
-5%
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