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Pomona IC Test Clip, 8 Way, SOIC Package, Gold Plated Contacts 5250
Specifications
| Country of Origin | United States |
|---|---|
| Brand | Pomona |
| Model | 5250 |
| Row Spacing | 0.35in |
| Contact Plating | Gold |
| IC Package Type | SOIC |
Key Features
- The test clip has 8 gold plated contacts ensuring reliable and noise-free connections.
- Row spacing of 0.35 inches matches SOIC package pin configuration.
- Upper contacts are 0.025" square pins spaced at 0.100" for compatibility with square pin receptacles and jumper leads.
- Molded barriers between contacts prevent accidental shorting on live boards.
- Ideal for hands-free, precise IC testing in laboratory and industrial environments.
- Made in the United States ensuring quality manufacturing standards.
Product Description
Pomona 5250 IC Test Clip, 8 Way is specifically engineered for in-circuit testing on Small Outline Integrated Circuits (SOIC). Featuring 8 gold plated contacts, this test clip assures a positive, noise-free connection to all chip leads.
The upper contacts are 0.025" square pins spaced at 0.100", suitable for square pin receptacles, wire-wrap, or jumper leads, providing versatile connectivity options.
Molded barriers between each contact allow secure connections on live boards without risk of accidental shorts to adjacent chip leads, making it safe for hands-free operation during testing.
This test clip is invaluable for industrial, laboratory, manufacturing, and electronics repair environments where precise, dependable IC testing is required. The 8 gold plated contacts ensure excellent conductivity and durability.
The 0.35 inch row spacing matches SOIC IC package pin layout accurately. Safe and secure connection design helps reduce testing errors and improve efficiency. The clip enables reliable, hands-free operation which enhances workflow and safety.
Manufactured in the United States, this product meets rigorous quality standards.
Choose Pomona 5250 IC Test Clip for trusted performance in electrical testing applications across various industries. Browse the full range of Electrical Test & Measurement connectors at EnvMart.
Explore more products in our Test & Measurement Connectors category.
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Frequently Asked Questions
The row spacing of the Pomona 5250 IC Test Clip is 0.35 inches, which matches the pin configuration of SOIC packages.
This model features 8 gold plated contacts, ensuring reliable and noise-free connections during testing.
The clip is specifically designed for Small Outline Integrated Circuits (SOIC).
The contacts of the Pomona 5250 IC Test Clip are gold plated, which enhances conductivity and durability.
The upper contacts are 0.025 inches square, spaced at 0.100 inches, making them suitable for square pin receptacles and jumper leads.
Yes, the Pomona 5250 includes molded barriers between contacts to prevent accidental shorting on live boards, enhancing safety during testing.
It is ideal for use in laboratory, industrial, manufacturing, and electronics repair environments where precise IC testing is required.
The Pomona 5250 IC Test Clip is manufactured in the United States, ensuring adherence to quality manufacturing standards.
The test clip provides a positive, noise-free connection to all chip leads, facilitating hands-free operation during testing.
This model is used for in-circuit testing of SOIC packages, making it suitable for a variety of electrical testing applications.
Gold plated contacts ensure excellent conductivity and durability, which helps reduce testing errors and improve efficiency.
The clip enables reliable, hands-free operation, which enhances workflow and safety in testing environments.
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